New NanoIndentation, NanoTribology, NanoFriction- and NanoHardness- Detection
from Anfatec
(Image Range: 500nm x 500 nm,
Cantilever: NSC15/AlBS,
Total Phase Differences: 30 deg, Drive: 30 nm)
- NanoTribology and Atomic Force Microscopy with One Instrument
- NanoIndentation with Atomic Force Modulation in Contact Mode
-
Friction Microscopy with Lateral Force Microscopy
- Detection of Hardness by Phase Imaging with Dynamic Mode-AFM
- Applications: NanoScience, Tribology, Hardness Testing, Materials Science, Biology, Ceramics, Composites, MEMS, Thin Films
- Ultra-High Stability Sample Stage for Large Sample Sizes
- Fully Digital
Control Electronics with Windows Operating Software
Link to the Anfatec AFM-Instrument for NanoTribology
