RHEED Data Acquisition and Processing Software SAFIRE

SAFIRE
is a powerful and easy to use RHEED evaluation software. It combines sophisticated
evaluation algorithms with extensive opportunities for data representation and
documentation. It can handle an arbitrary number of parallel measurements and
offers fast real-time data exchange with MBE controller for closed feedback
loop operation.
Multiple
measurements can be stored in the same display for comparison. The temporal
resolution in all measurement modes is 20 ms, Kikuchi line analysis, azimuthal
scans, integration with 16 bit resolution and on-chip-integration keep you at
the forefront of RHEED research.
Highlights:
SAFIRE
combines the user interface and the easy use from Windows® application with
the live display of the camera picture on the same screen.
The number
of sensors and the data acquisition period is only limited by the hardware.
One-, two- and three dimensional data can be acquired simultaneously and at
individually different time intervals. SAFIRE's multitasking concept allows
you to start or stop measurements while others are running, or to analyze your
data while the measurement is running. The possibility to generate Tiff format
screen-shots at any time, even during the measurement, puts you in control of
the data. On-chip as well as software integration, 16 bit internal resolution
and A/D reference scaling lets you pick up even weakest signals.
SAFIRE
combines the power of a high-end system with the easy of use needed for everyday
tasks like growth rate calibration. It's continuously growing processing module
library keeps you abreast with the latest developments in RHEED research.

Download
your SAFIRE VIDEO RHEED Image Processing Application Note
(PDF)
Technical
Data:
- Arbitrary
number, shape and size of areas of interest (sensors)
- 40 ms
acquisition rate, 20 ms mode in preparation
- On-chip
integration for minimum noise at low signal levels
- Fast
bi-directional digital/analog signal bus to EMERALT MBE controller
- Multitasking
technology for independent parallel measurements
- Extensive
triggering capabilities
- Pre-trigger
for easy adjustment and recording of data before measurement starts
- Multiple
repetitions of measurement stored in the same data set for easy comparison
and parallel evaluation
- Continuously
growing library of processing and fitting algorithms:
- Lattice
constant determination
- FWHM
of reflections as a function of time
- Fourier
transforms in space and time
- Integration
in space and time for reduction of dimensionality
- Slicer
to extract data
- Kikuchi
line analysis
- Full
length and running average sine fit
- Azimuthal
scan for LEED-type cuts through reciprocal space
- Integration
of Oxford RHEED Gun for automated control
of all beam parameters
- High
resolution, high speed camera
Hardware Specifications:
A/D-D/A Converter-Board
PCI
- Type: BMC- PCI-BASE
300 High speed
- Resolution: A/D 16 BIT
min. : D/A 16 BIT min.
- Speed: 333 kHz 2d2"
- Voltage: A/D range +/-
1, 2, 5, 10V and 0-5V: D/A range +/- 5, 10V
- Input: A/D 16, D/A 2
- Digital-I/0 implement
- TTL Input: 16, TTL Output:
16
- Energy steps: at energy
ramp 0-3000 eV in steps of 0,04 eV.
- FIFO: 4 kByte
- Rel. accuracy in the
measuring ranges: 0,0015 %.
- Converter rate: 10µs.
Capture-Board AGP:
- Type: ASUS AGP-V6800
Deluxe
- Speed: ASUS LIVE Real-time
30 fps 704 x 480 video capture
- Driver CD: Windows
98, Windows, Microsoft DirectX driver, GART driver, interactive products tutorials
- Powered by GeForce256
DDR GPU
- 300MHz video memory
- RAM: 32 MB DDR Video
Memory
- Remark: High speed
30 fps by Windows 98 only realize
- Image: 4:3 (4 horizontal
: 3 vertical)
- Solution: 8 BIT (256
gray scale) with full pixels image 4:3
- Transmission: more
than 2 Mbytes/sec. (optimal Computer configuration)
- Video in: 1 x SVHS
non compression, 1 x Cinch non-compression
- Video out: 1 x SVHS,
1 x Cinch
- VGA: 1 x SUB-D Monitor
- Peak fill rate of 480
million bilinear filtered, multi-textured pixels and more than 3.8 gigatexels
per second. Up to 15 million triangles per second at peak rates. 32 Bit Z
and stencil buffer.

Computer
Software:
- Windows® 98/2000/NT
compatible software, 32 bit
Real-time measurement of intensities of spots as function of energy i.e. I(V)-curves,
I(t) measurements, R-factor analysis, of time oscillations, temperature and
other parameters. Data analysis can be carried out either directly or from
saved images and profile measurement (line scan). The I/V spectra can be either
normalized with the beam current or not.
- 8 windows for intensity
measurement (free selectable in position and size), 18 spots tracking
- Real-time integration
and imaging
- On-line (on/off) background
subtraction
- Signal averaging
- Automatic maximum location
of single spots Automatic window tracking (I/V-curves)
Profiles (line scans) in any direction or dimension
- Measurement of up to
8 external parameters (i.e. primary current, temperature, pressure, energy)
- Gray- and colour-look-up-table
- R-factor-comparison
(Pendry and R2)
- Software video recorder
for subsequent analysis of I (t) measurements
- Control of RHEED-,
other power supplies and control of experiments
- Easy to use by mouse
or menu
- Data processing, addition,
subtraction, multiplication, division -of numbers and spectra-, differentiation,
integration and background subtraction, FWHM measurement
- Data output in standard
ASCII / Tiff / Bitmap format and on HP laser printer and HP video printer
CCD-Camera:
-
High Performance, low-light
near-infrared CCD-camera, with lenses, manual and automatic gain control,
including power supply
- Image area is 6.4*4.8
mm
- 795x596 Pixels, 48dB
S/N-ratio,
- Resolution 600 lines
(horizontal)
- Sensitivity (min detectable
signal at sensor): 0.02 Lx.
- Compatible with the
RHEED screen (phosphor coated glass screen)
Options:
- VCR, amplifier, Peltier-cooled
CCD-camera and video printer
Download
your SAFIRE VIDEO RHEED Image Processing System Brochure
(PDF)
SPECS Technologies Corporation
3318 Plantation Dr.
Sarasota, Florida 34231
Phone: (941) 362-4877
Fax: (941) 364-9706
support@specs.com
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