The AFIF sample holders are designed to mount (non-bonded) complete wafers or wafer pieces of different sizes without using Indium.

• The special design allows a quick and easy sample exchange of complete or shaped wafers.
• The design allows you to investigate the wafer surface by RHEED without shadows by the wafer fixing.
• The creation of particles during wafer exchange is minimized.
• The holder can be used many times without removing the covering of the condensated material.
• Various kinds, shapes and sizes of wafers can be mounted.
• This results in best yields from cleaved wafer pieces.
• The sample holders are compatible with all common MBE systems (RIBER, VG, EPI and other).